Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications

Book Details:

• Publisher: CRC Press

• Author: Alina Bruma

• Language: English

• Edition: 1st Edition

• ISBN: 9780367197360

• Pages: 150

• Cover: Hardcover

• Dimensions: 9.6 x 6.3 x 0.6 inches

About the Book:

Scanning Transmission Electron Microscopy by Alina Bruma provides an in-depth exploration of the latest advancements in scanning transmission electron microscopy (STEM), focusing particularly on the recording of high-fidelity quantitative annular dark-field (ADF) data. The book delves into cutting-edge approaches that combine traditional microscopy with modern computational methods, including machine learning, to enhance the precision and efficiency of electron microscopy for complex material analysis.

The text covers the current best practices in experimental design for ADF data recording, addressing the most common types of scintillator-photomultiplier ADF detectors and their respective strengths and weaknesses. It offers strategies to minimize errors during data collection and interpretation, especially in materials that are challenging to analyze using conventional STEM methods.

Key topics include:

• The practice of reliable multiframe imaging and its advantages in managing electron dose and dose-rate.

• An exploration of both supervised and unsupervised machine learning techniques applied to electron microscopy, advancing the analysis of nanostructures.

• A discussion on open data formats, community-driven software, and the integration of data repositories to enhance collaborative research efforts.

• Innovative methods for handling large, multidimensional datasets, improving the storage, transfer, and analysis of complex data.

• New instrumentation developments for studying materials at the resolution limit, offering unprecedented insight into material properties.

The book also covers quantitative structural characterization techniques for sensitive nanomaterials using electron diffraction, providing strategies to collect and analyze electron diffraction patterns for such materials.

This highly specialized book is an essential resource for academics, researchers, and professionals in materials science, chemistry, physics, and related fields. It equips readers with advanced computational tools and methodologies for analyzing and interpreting materials properties, pushing the boundaries of what is possible in electron microscopy.