Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science)
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Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applic...
Book Details
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Author: Andrei Benediktovich
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Brand: Springer
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Edition: 2014 ed.
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Binding: Hardcover
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Number of Pages: 318
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Release Date: 18-09-2013
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Languages: English
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ISBN: 9783642381768
About the Book
This comprehensive book provides a concise survey of modern theoretical concepts in X-ray materials analysis. It covers the basics of X-ray scattering, the interaction between X-rays and matter, and presents new theoretical concepts of X-ray scattering. The book explores various X-ray techniques in detail, including:
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High-resolution X-ray diffraction
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X-ray reflectivity
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Grazing-incidence small-angle X-ray scattering
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X-ray residual stress analysis
The theoretical methods presented in the book adopt a unified physical approach, making it especially useful for readers who are learning and performing data analysis using different techniques. The theory is applicable to bulk materials, including single crystals, polycrystals, and surface studies under grazing incidence. This book is ideal for both researchers and graduate students in materials science, physics, and related fields.
