Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Book Details

• Author: Patrick Echlin

• Publisher: Springer

• Edition: 2009 ed.

• Binding: Hardcover

• Format: Import

• Number of Pages: 332

• Release Date: 19-03-2009

• ISBN: 9780387857305

• Package Dimensions: 10.1 x 7.1 x 0.9 inches

• Languages: English

About the Book

The Handbook of Sample Preparation for Scanning Electron Microscopy and X-ray Microanalysis provides a comprehensive guide to the preparation of specimens for SEM and X-ray microanalysis. These techniques allow for detailed imaging and in situ chemical analysis of a variety of specimens, from inorganic to organic materials, and even biological and geological samples.

This book addresses the challenges that arise when preparing samples for these powerful instruments, particularly when dealing with specimens that are poor conductors or sensitive to the beam. With specific attention to the intricacies of preparing samples for SEM and X-ray microanalysis, this handbook is indispensable for researchers and laboratory professionals who work with scanning electron microscopes.

The book includes:

• Detailed preparation "recipes" for a wide range of materials, including metals, polymers, semiconductors, biological samples, and geological materials.

• Photomicrographs that complement the sample preparation instructions.

• General features of specimen preparation, emphasizing the needs of SEM and X-ray microanalysis.

• An appendix with chemicals and equipment for sample preparation.

Key Features:

• Comprehensive Guide: Covers a wide variety of sample types including inorganic, organic, biological, and geological materials.

• Self-contained: Describes the necessary preparations up to the point when the sample enters the instrument.

• Practical and Essential: Serves both as a reference for beginners and an authoritative guide for experienced microscopists.

• Photomicrographs and Sample Preparation "Recipes": Provides visual aids and step-by-step instructions to ensure optimal results.

Reviews:

“This handbook should find its way to the reference bookshelf of all imaging laboratories. It should also become required reading for anyone being trained for SEM work, or anyone who might need to have their samples examined by using such techniques.”
— Iolo ap Gwynn, Microscopy and Microanalysis, 2010

About the Author:

Patrick Echlin was a lecturer in the Department of Plant Sciences and Director of the Multi-Imaging Centre at the University of Cambridge until his retirement in 1999. He has taught for over thirty years at the Lehigh University Microscopy School and authored/co-authored eight books on scanning electron microscopy and X-ray microanalysis. He is also an Honorary Fellow of the Royal Microscopical Society and received the Distinguished Scientist Award in Biological Sciences from the Microscope Society of America in 2001.

This practical handbook is an essential resource for anyone using scanning electron microscopes and X-ray microanalysis, providing the necessary knowledge to achieve precise and reliable results in sample preparation.