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Geometrical Charged-Particle Optics: 142 (Springer Series in Optical Sciences)

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Book Details

  • Author: Harald Rose

  • Brand: Springer

  • Edition: 2nd ed. 2012

  • Binding: Hardcover

  • Format: Import

  • Number of Pages: 507

  • Release Date: 03-02-2013

  • ISBN: 9783642321184

  • Package Dimensions: 9.2 x 6.3 x 1.3 inches

  • Languages: English


About the Book

Geometrical Charged-Particle Optics (2nd Edition) is a comprehensive and updated guide aimed at researchers and graduate students interested in the design of instruments and beam-guiding systems for charged particles. This second edition extends the concepts covered in the first edition and includes significant updates that incorporate wave aspects of charged-particle optics, providing insights into complex phenomena such as electron holography, the Aharonov-Bohm effect, and diffraction-limited resolution in electron microscopes.

Key topics discussed in this edition include:

  • Calculation of electromagnetic fields and the design of systems with curved axes

  • Detailed methods for designing and optimizing aberration correctors, spectrometers, ion traps, electron mirrors, and cathode lenses

  • In-depth coverage of rotationally symmetric lenses, quadrupoles, and beam properties (emittance, brightness, and transmissivity)

  • Exploration of relativistic motion and spin precession of electrons in a covariant framework

  • Revisit of the Stern-Gerlach effect and its implications for atomic and free electrons

This book is a vital resource for those looking to design and optimize systems for charged particles, with practical methodologies outlined for solving problems related to beam optics, electromagnetic fields, and the interactions of particles with fields.


Review

The second edition of Geometrical Charged-Particle Optics is a crucial text for advanced students and researchers in charged-particle optics, electron microscopy, and beam-guiding systems. It provides a solid theoretical foundation while incorporating practical design techniques, making it an indispensable resource for those studying and working in the field of electron optics and microscopy. The book’s inclusion of wave aspects and relativistic treatments offers new perspectives, making it a valuable reference for both experimental and theoretical research in the domain.